Recherche

F2 – MET-FEG (200 kV) – JEOL

F2 – MET-FEG (200 kV) – JEOL

TEMs 200KV

TEMs 200KV

JEM-F200 Cold FEG Electron Microscope - Nanomaterials Core Characterization  Facility - Virginia Commonwealth University

JEM-F200 Cold FEG Electron Microscope - Nanomaterials Core Characterization Facility - Virginia Commonwealth University

Compensateurs de champs magnétiques – JEOL

Compensateurs de champs magnétiques – JEOL

Microscope TEM - JEM-1400Flash - Jeol - optique / biologique / polyvalent

Microscope TEM - JEM-1400Flash - Jeol - optique / biologique / polyvalent

JEM-F200 - JEOL (Germany) GmbH and Nordic (AB)

JEM-F200 - JEOL (Germany) GmbH and Nordic (AB)

Transmission electron microscope - JEM-F200 - Jeol - for analysis / bright  field / dark field

Transmission electron microscope - JEM-F200 - Jeol - for analysis / bright field / dark field

Microscope électronique à transmission - JEM-F200 - Jeol - pour analyse / à  champ clair / en champ sombre

Microscope électronique à transmission - JEM-F200 - Jeol - pour analyse / à champ clair / en champ sombre

Electron Optics, Product Presentations

Electron Optics, Product Presentations