F2 – MET-FEG (200 kV) – JEOL
TEMs 200KV
JEM-F200 Cold FEG Electron Microscope - Nanomaterials Core Characterization Facility - Virginia Commonwealth University
Compensateurs de champs magnétiques – JEOL
Microscope TEM - JEM-1400Flash - Jeol - optique / biologique / polyvalent
JEM-F200 - JEOL (Germany) GmbH and Nordic (AB)
Transmission electron microscope - JEM-F200 - Jeol - for analysis / bright field / dark field
Microscope électronique à transmission - JEM-F200 - Jeol - pour analyse / à champ clair / en champ sombre
Electron Optics, Product Presentations
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